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Figure 1 | BMC Neuroscience

Figure 1

From: Self-organized criticality in structured neural networks

Figure 1

A: Retrieval performance for networks with dynamical synapses and subject to Hebbian learning for different load parameters α. Shown is the average overlap between stored patterns and the corresponding retrieved patterns. Dashed lines indicate overlaps corresponding to an average distortion by two digits (lower line) and one digit (upper line). B: Average mean-squared deviation Δγ from the best-fit power law. All data points lie below the threshold of Δγ = 0.005 for critical distribution. The inset shows an example avalanche size distribution P(L) in the converged state and the red dashed line marks the slope of the best-fit power law.

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